ligitek electronics co.,ltd. property of ligitek only dual color type led lamps LHRFSBKS2093 data sheet - 2005 b 16 - nov. doc. no : qw0905- rev. : date : LHRFSBKS2093
hrf 4.0 sbks 5.2 6.7 0.5 4.2 23 1 1 2 3 2.0min 2.54typ 1.anode blue 2.common cathode 3.anode red 18.0min 1.5 max 0.5 typ 2.0min 2.54typ 3.0 1/5 page ligitek electronics co.,ltd. property of ligitek only part no. package dimensions LHRFSBKS2093 note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation
typ. 3.5 ---- 50 electrostatic discharge( * ) esd 2000 v 500 2/5 sbks page unit hrf symbol LHRFSBKS2093 parameter ligitek electronics co.,ltd. property of ligitek only ratings part no. absolute maximum ratings at ta=25 " 10 120 100 " " # a mw ma 90 75 i fp ir pd t opr tstg tsol -20 ~ +80 max 260 " for 5 sec max (2mm from body) -30 ~ +100 viewing angle 2 $ 1/2 (deg) 30 30 typ. min. luminous intensity @20ma(mcd) min.max. forward voltage @20ma(v) 350 300 160 160 ---- 1.5 4.2 2.4 dominant wave length % dnm lens 630 475 emitted material blue red ingan/sic algainp water clear color 26 20 spectral halfwidth &% nm operating temperature LHRFSBKS2093 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. typical electrical & optical characteristics (ta=25 " ) part no soldering temperature storage temperature reverse current @5v peak forward current duty 1/10@10khz power dissipation 30 ma 30 forward current i f static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. *
r e l a t i v e i n t e n s i t y @ 2 0 m a 600 wavelength (nm) 550 0 700 650 0.5 0.5 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 20 ambient temperature( ) fig.5 relative intensity vs. wavelength 1.0 ambient temperature( ) 0.8 -0 -20 -4060 40 2080100 0 -40-20-060 4080100 fig.4 relative intensity vs. temperature 2.5 1.0 0.9 1.1 1.5 1.0 2.0 fig.3 forward voltage vs. temperature 1.2 3.0 100 r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a f o r w a r d c u r r e n t ( m a ) forward current(ma) forward voltage(v) 1.5 1.0 0.1 2.5 2.03.01.010 0 1.0 10 0.5 1.0 1.5 2.0 1001000 fig.2 relative intensity vs. forward current fig.1 forward current vs. forward voltage 1000 3.5 2.5 typical electro-optical characteristics curve ligitek electronics co.,ltd. property of ligitek only 3.0 hrf chip part no. LHRFSBKS2093 page 3/5
4/5 page ligitek electronics co.,ltd. property of ligitek only part no. LHRFSBKS2093 1.25 1.5 fig.2 relative intensity vs. forward current 20 101525 30 0.5 0.75 0.25 0 forward voltage(v) 5 0 345 forward current(ma) r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a 1.0 sbk-s chip 20 25 30 15 10 5 0 1 f o r w a r d c u r r e n t ( m a ) typical electro-optical characteristics curve fig.1 forward current vs. forward voltage 2 1.0 0.5 fig.4 relative intensity vs. wavelength wavelength (nm) 75 50100 r e l a t i v e i n t e n s i t y @ 2 0 m a 580 380 0 480 480 430 530 630 680 30 40 20 10 0 f o r w a r d c u r r e n t @ 2 0 m a 0 fig.3 forward current vs. temperature ambient temperature( ) 25
5/5 page reference standard description test condition part no. test item reliability test: LHRFSBKS2093 ligitek electronics co.,ltd. property of ligitek only mil-std-883:1008 jis c 7021: b-10 mil-std-202:103b jis c 7021: b-11 jis c 7021: b-12 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) the purpose of this test is the resistance of the device under tropical for hous. the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.t.sol=230 5 2.dwell time=5 1sec 1.t.sol=260 5 2.dwell time= 10 1sec. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. high temperature storage test high temperature high humidity test low temperature storage test thermal shock test solderability test solder resistance test this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. operating life test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1
|
